Kollektanee - Samuel Gyger

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====== NbTiN - Niobium Titanium Nitride ======
NbTiN is a superconductor with a $T_c = 16-18 K $ and a critical field of $B = 13 T$ in the NaCL-phase \cite{Yen1967}. It is commonly used as thin-film in superconducting devices were we observer a $T_C > 9 \mathrm{K}$.

===== Material analysis =====

{{paperTable>Jia2015}}

Alloy with 43 wt. % Ti and 53 wt. % Nb. $5 \mathrm{nm}$ to $20 \mathrm{nm}$ on MgO and Si and SiO<sub>x</sub>-Si substrates using DC magnetron sputtering. By adding Ti to NbN resistivity and kinetic inductance is lowered, improving the performance citing \cite{Mike2009}. NbN and NbTiN has a cubic structure with a smaller lattice with Ti.
Analyzing the composition:
  * Auger electron energy spectrometer for the composition
  * High-resolution transmission electron microscopy (TEM) for the structure
  * X-ray diffraction (XRD) for information about the crystal structure.

Smaller lattice mismatch to MgO Nb: $5.9\%$, NbTiN: $4\%$ \cite{Mike2009}, NbTiN: $2.9\%$.
No measurement conducted on detectors.


{{paperTable>Zhang2015b}}

NbTiN (4-100 nm) on MgO by reactive DC magnetron sputtering. With high superconducting critical
temperature of 10.1 K, low resistivity (q20¼93 lXcm), and residual resistivity ratio of 1.12
achieved for 4-nm-thick ultrathin NbTiN films prepared at the deposition current of 2.4 A.
At a NaCl structure, in which the metallic atoms form a face-centered cubic lattice and the nonmetallic atoms occupy all octahedral interstices.
The chemical composition varies with the film thickness.

Analyzing the composition:
  * X-Ray photoelectron spectroscopy (XPS)
  * X-ray diffraction (XRD)
===== Deposition =====

{{paperTable>Shan2015}}

Sputtering pressure influences film resistivity but not the superconducting properties such as T_c and gap energy.
Q factor for resonators independent of normal state resistivity. Coplanar waveguides (CPW) have a higher Q than the stacked structure.
Kollektanee - Samuel Gyger

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